This article is cited in 10 papers

Spectral characteristics of nanometer-thick chromium films in terahertz frequency range

V. G. Andreev^a, A. A. Angeluts^a, V. A. Vdovin^b, V. F. Lukichev<sup>c

a</sup> Lomonosov Moscow State University
^b Kotelnikov Institute of Radioengineering and Electronics of the Russian Academy of Sciences, Moscow
^c Valiev Institute of Physics and Technology of Russian Academy of Sciences

Abstract: The spectral characteristics (reflection, transmission, and absorption coefficients) of thin chromium films on silica substrates have been measured using a pulsed source of terahertz radiation. The spectra of optical coefficients were obtained in a frequency range of 0.25–1.1 THz. Dependences of the optical coefficients on the metal film thickness at 1 THz were constructed. The maximum absorption coefficient (43%) was observed at a film thickness of 10 nm.

Received: 10.09.2014

 English version: Technical Physics Letters, 2015, 41:2, 180–183

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