Method of correction of weak spatial inhomogeneities of a flat-panel x-ray CCD detector

Yu. A. Bronvald^a, S. B. Vakhrushev^a, O. A. Alekseeva^a, A. S. Budaev<sup>b

a</sup> Ioffe Institute, St. Petersburg, Russia
^b Peter the Great St. Petersburg Polytechnic University, St. Petersburg, Russia

Abstract: In the matrix CCD detectors which are used in X-ray single-crystal diffractometers, distortions associated with the heterogeneity of their surface may appear. The presence of such heterogeneity leads to distortion of diffraction data. In this paper, a simple and effective method for compensating of weak distortions of diffraction images caused by spatial heterogeneity of the detector surface is considered. The method is based on the use of reference images taken on calibration powders and consists of creating a special correction mask. It is shown that the described approach allows for a significant improvement in the accuracy of data collection.

Keywords: CCD detector, x-ray diffractometer, ccd detector distortion correction.

Received: 12.09.2024
Revised: 12.09.2024
Accepted: 07.10.2024

DOI: 10.61011/PJTF.2025.03.59820.20118

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