Influence of the working surface roughness of the pulsed X-ray radiation galvanic sensor on its performance

I. A. Barykov^ab, A. V. Butashin^c, V. I. Zaitsev^a, A. È. Muslimov^c, I. A. Tarakanov^d, A. M. Ismailov^e, V. A. Fedorov^c, V. M. Kanevskii<sup>c

a</sup> Troitsk Institute for Innovation and Fusion Research, Troitsk, Moscow, Russia
^b Peoples' Friendship University of Russia named after Patrice Lumumba, Moscow
^c FSRC "Crystallography and Photonics" RAS
^d Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow
^e Daghestan State University, Makhachkala, Dagestan Republic, Russia

Abstract: A new design of a galvanic sensor of pulsed X-ray radiation is proposed, which is a flat electric capacitor with a window in one metal lining and a solid dielectric made of a single-crystal sapphire with a thickness of 200–300 $\mu$m inside. The influence of the surface roughness of the sapphire in the window area on the galvanic linear sensor of X-ray radiation has been established. Tests have shown that, with ultra-smooth polishing of the sapphire plate working surface in the window area to a roughness of $R_q\le$ 0.2 nm, it is possible to provide the galvanic linear detection of X-rays with an energy in the range of 0.1–1 keV and power density of 1–2 MW $\cdot$ cm$^{-2}$ with a sensor response time of about 8 ns. Sensors of this type can be used in studies of inertial nuclear fusion processes.

Keywords: X-ray radiation, galvanic sensor, sapphire, dielectric, flat capacitor.

Received: 12.12.2022
Revised: 01.03.2023
Accepted: 01.03.2023

DOI: 10.21883/PJTF.2023.09.55319.19461

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