N. A. Davletkildeev, D. V. Sokolov, V. V. Bolotov, I. A. Lobov, “Electrostatic force microscopy evaluation of the conductivity of individual multiwalled carbon nanotubes”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 2017, Volume 43, Issue 4,Pages <nobr>47

This article is cited in 7 papers

Electrostatic force microscopy evaluation of the conductivity of individual multiwalled carbon nanotubes

N. A. Davletkildeev^ab, D. V. Sokolov^a, V. V. Bolotov^a, I. A. Lobov^ab

^a Omsk Scientific Center, Siberian Branch of the Russian Academy of Sciences
^b Omsk State University

Abstract: The electric conductivity of individual multiwalled carbon nanotubes (CNTs) doped with nitrogen has been studied in as-synthesized, heat-treated, and argon-ion-irradiated states by the method of electrostatic force microscopy (EFM). Modelling of transverse cross-section profiles of EFM images were used to determine the potential difference across the probe tip–CNT gap $(U_{\operatorname{tip-CNT}})$, which is a parameter related to the conductivity of CNTs. A strong correlation between the specific volume conductivity of a CNT layer and average $U_{\operatorname{tip-CNT}}$ value has been found for all types of samples. It is established that a change in the conductivity of N-doped CNTs upon thermal annealing and argon-ion irradiation is caused by modification of the composition and/or concentration of defects in CNT walls.

Received: 26.09.2016

DOI: 10.21883/PJTF.2017.04.44297.16489