V. V. Balashev, K. S. Ermakov, L. A. Chebotkevich, V. V. Korobtsov, “Electrical and magnetic properties of ultrathin polycrystalline Fe films grown on SiO<nobr>$_{2}$</nobr>/Si(001)”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 2018, Volume 44, Issue 13,Pages <nobr>88

This article is cited in 6 papers

Electrical and magnetic properties of ultrathin polycrystalline Fe films grown on SiO$_{2}$/Si(001)

V. V. Balashev^ab, K. S. Ermakov^b, L. A. Chebotkevich^b, V. V. Korobtsov^ab

^a Institute for Automation and Control Processes, Far Eastern Branch of the Russian Academy of Sciences, Vladivostok
^b School of Natural Sciences, Far Eastern Federal University, Vladivostok

Abstract: Ultrathin polycrystalline Fe films have been grown on the oxidized surface of a Si(001) substrate. The resistivity and magnetic hysteresis of Fe films have been measured in the range of thickness from 2.5 to 10 nm. Based on the analysis of the data obtained, it is suggested that there is a transition to the structurally continuous film at a thickness of $\sim$6 nm. It is found that Fe grains in this film acquire the preferred (111) orientation during this transition.

Received: 20.03.2018

DOI: 10.21883/PJTF.2018.13.46332.17304