This article is cited in 1 paper

Measuring the extinction index of dielectric films using frustrated total internal reflectance spectroscopy

V. B. Nguyen, L. A. Gubanova

St. Petersburg National Research University of Information Technologies, Mechanics and Optics

Abstract: Various methods of measuring the coefficient of light attenuation in optical coatings are considered. It is shown that the dimensionless extinction index of a coating made of a weakly absorbing film-forming material can be measured using a special attachment based on a parallelepiped-shaped optical prism. Parameters of the proposed attachment are calculated so that it could be arranged inside standard spectrophotometers.

Received: 16.01.2018

DOI: 10.21883/PJTF.2018.16.46481.17212

 English version: Technical Physics Letters, 2018, 44:8, 746–748

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