This article is cited in 3 papers

Intracavity waveguide spectroscopy of thin films

A. V. Shulga, A. V. Khomchenko, I. V. Shilova

Belarusian-Russian University, Mogilev, Belarus

Abstract: The method of intracavity waveguide spectroscopy for measuring low optical losses in thin films is proposed. The method also allows one to distinguish transverse and longitudinal modes in low-gain lasers without introducing considerable losses into the cavity.

Received: 05.06.2018

DOI: 10.21883/PJTF.2018.21.46849.17418

 English version: Technical Physics Letters, 2018, 44:11, 953–955

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