Abstract:
Epitaxial Sr$_{0.5}$Ba$_{0.5}$Nb$_{2}$O$_{6}$/MgO thin films with layers of differing thickness (but with identical total thickness) have been prepared by radio-frequency magnetron sputtering with application of discontinuous deposition technology. It is established that a decrease in the layer thickness intensifies the unit-cell deformation, which is retained if the thickness of subsequent layers does not exceed the critical value.