Optical time-of-flight diagnostics of intense pulsed ion beams

V. A. Ryzhkov, B. A. Nechaev, V. N. Padalko

Research School of High-Energy Physics, Tomsk Polytechnic University

Abstract: Ablation of a thin surface contamination layer is used to control fluencies of intense pulsed ion beams. The layer is self-restored after each ion pulse. An optical time-of-flight spectrometer measures velocities of the lightest components of the ablation plasma, hydrogen and carbon, to determine the ion fluence.

Keywords: surface contamination, energy input, ablative plasma, hydrogen, carbon.

Received: 05.11.2019
Revised: 16.01.2020
Accepted: 20.01.2020

DOI: 10.21883/PJTF.2020.07.49222.18097

 English version: Technical Physics Letters, 2020, 46:4, 354–356

Bibliographic databases:

•