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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2021 Volume 47, Issue 7, Pages 26–29 (Mi pjtf4813)

This article is cited in 2 papers

Application of the scattering matrix method for calculation of impurity states in semiconductor structures

S. V. Morozovab, M. S. Zholudevab

a Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
b Lobachevsky State University of Nizhny Novgorod

Abstract: The scattering matrix method is adapted for calculation of energy levels and charge carrier wavefunctions near impurity-defect centers. The possibility of application of this method for multiband models is exemplified by the Luttinger Hamiltonian with a Coulomb acceptor with the spherical symmetry approach. The obtained values of energy of discrete levels are in good agreement with the results of calculations performed by other methods.

Keywords: HgCdTe, impurity, narrow-band-gap semiconductors, scattering matrix.

Received: 18.12.2020
Revised: 18.12.2020
Accepted: 21.12.2020

DOI: 10.21883/PJTF.2021.07.50795.18663


 English version:
Technical Physics Letters, 2021, 47:5, 360–363

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© Steklov Math. Inst. of RAS, 2026