This article is cited in 1 paper

The effect of scattered electrons on the noise figure of cyclotron protective devices

S. V. Bykovskiy

Research and Production Corporation "Istok" named after Shokin, Fryazino, Moskovskaya obl.

Abstract: The effect of scattered beam electrons on the noise parameters of cyclotron protective devices in the microwave frequency band is experimentally investigated. It is shown that the beam electrons scattered by the residual gas particles are a source of additional noise of the device. The object of research was commercially available samples of cyclotron protective devices.

Keywords: cyclotron protective device, ribbon electron beam, fast cyclotron wave, noise figure.

Received: 14.01.2021
Revised: 26.03.2021
Accepted: 29.03.2021

DOI: 10.21883/PJTF.2021.12.51069.18711

 English version: Technical Physics Letters, 2021, 47:8, 593–596

Bibliographic databases:

•