This article is cited in 4 papers

Wave effects in a coaxial transmission line under subnanosecond switching of a high-voltage diode in the delayed impact-ionization breakdown mode

M. S. Ivanov, V. I. Brylevsky, P. B. Rodin

Ioffe Institute, St. Petersburg

Abstract: A theoretical analysis is carried out of wave processes in a coaxial transmission line during subnanosecond switching of a high-voltage pulse sharpening diodes (sharpeners). The relationships are found between the amplitudes of the incident, reflected and transmitted waves and the voltages measured in the experiment, as well as between the measured voltages and the pulse shape of the generator. The voltage doubling effect on the diode before switching is calculated. On the basis of the obtained analytical formulas and experimental data, the time dependence of the reflection coefficient of the sharpener is determined and the wave processes in the channel during its switching are reconstructed.

Keywords: semiconductor devices, impact ionization, subnanosecond switches, coaxial transmission line.

Received: 31.03.2021
Revised: 31.03.2021
Accepted: 02.04.2021

DOI: 10.21883/PJTF.2021.13.51119.18794

 English version: Technical Physics Letters, 2021, 47:9, 661–664

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