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JOURNALS // Pisma v Zhurnal Tekhnicheskoi Fiziki // Archive
Pisma v Zhurnal Tekhnicheskoi Fiziki, 1986 Volume 12, Issue 3, Pages 175–179 (Mi pjtf42)
Raman measurement of the refractive silicon index during pulsed laser annealing

G. M. Gusakov, A. A. Komarnitskiĭ, S. S. Sarkisyan


Received: 14.10.1985



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