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JOURNALS // Pisma v Zhurnal Tekhnicheskoi Fiziki // Archive
Pisma v Zhurnal Tekhnicheskoi Fiziki, 1989 Volume 15, Issue 24, Pages 72–76 (Mi pjtf3031)
USE OF EXCITED ION-BEAMS FOR THE MEASURING THE ION-OPTICAL SYSTEM CHARACTERISTICS

S. F. Belykh, R. N. Evtukhov, U. Kh. Rasulev, I. V. Redina




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