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Fizika i Tekhnika Poluprovodnikov, 2010 Volume 44, Issue 10, Pages 1357–1364 (Mi phts8950)

This article is cited in 1 paper

Low-dimensional systems

Quantum wells on 3C-SiC/NH-SiC heterojunctions. Calculation of spontaneous polarization and electric field strength in experiments

I. S. Sbruev, S. B. Sbruev

Moscow Aviation Institute (State Technical University)

Abstract: The results of experiments with quantum wells on 3C-SiC/4H-SiC and 3C-SiC/6H-SiC heterojunctions obtained by various methods are reconsidered. Spontaneous polarizations, field strengths, and energies of local levels in quantum wells on 3C-SiC/NH-SiC heterojunctions were calculated within a unified model. The values obtained are in agreement with the results of all considered experiments. Heterojunction types are determined. Approximations for valence band offsets on heterojunctions between silicon carbide polytypes and the expression for calculating local levels in quantum wells on the 3C-SiC/NH-SiC heterojunction are presented. The spontaneous polarizations and field strengths induced by spontaneous polarization on 3C-SiC/4H-SiC and 3C-SiC/6H-SiC heterojunctions were calculated as 0.71 and 0.47 C/m$^2$ and 0.825 and 0.55 MV/cm, respectively.

Received: 23.03.2010
Accepted: 07.04.2010


 English version:
Semiconductors, 2010, 44:10, 1313–1320

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