Abstract:
Epitaxial In$_x$Ga$_{1-x}$As/GaAs(100) heterostructures grown by the MOC-hydride method with a considerable lattice mismatch are studied by X-ray diffraction and scanning electron microscopy. The relaxation coefficient of the crystal lattice of the epitaxial alloy is calculated and the deformation energy is evaluated. It is shown that, at a concentration of the In atoms in metal sublattice close to $x$ = 0.5, the superstructural phase formed on the surface of the epitaxial In$_x$Ga$_{1-x}$As alloy is the InGaAs$_2$ compound with a layered tetragonal crystal lattice and ordered arrangement of the atoms of the metal sublattice in the growth plane of the epitaxial film.