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Fizika i Tekhnika Poluprovodnikov, 2010 Volume 44, Issue 8, Pages 1140–1146 (Mi phts8905)

This article is cited in 8 papers

Manufacturing, processing, testing of materials and structures

Relaxation of crystal lattice parameters and structural ordering in In$_x$Ga$_{1-x}$As epitaxial alloys

P. V. Seredina, A. V. Glotova, È. P. Domashevskayaa, I. N. Arsent'evb, D. A. Vinokurovb, A. L. Stankevich, I. S. Tarasovb

a Voronezh State University
b Ioffe Institute, St. Petersburg

Abstract: Epitaxial In$_x$Ga$_{1-x}$As/GaAs(100) heterostructures grown by the MOC-hydride method with a considerable lattice mismatch are studied by X-ray diffraction and scanning electron microscopy. The relaxation coefficient of the crystal lattice of the epitaxial alloy is calculated and the deformation energy is evaluated. It is shown that, at a concentration of the In atoms in metal sublattice close to $x$ = 0.5, the superstructural phase formed on the surface of the epitaxial In$_x$Ga$_{1-x}$As alloy is the InGaAs$_2$ compound with a layered tetragonal crystal lattice and ordered arrangement of the atoms of the metal sublattice in the growth plane of the epitaxial film.

Received: 15.12.2009
Accepted: 21.12.2009


 English version:
Semiconductors, 2010, 44:8, 1106–1112

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