Amorphous, glassy, porous, organic, microcrystalline semiconductors, semiconductor composites

A study of Raman and rutherford backscattering spectra of amorphous carbon films modified with platinum

A. D. Remenyuk^a, T. K. Zvonareva^a, I. T. Serenkov^a, V. I. Sakharov^a, T. S. Perova^b, J. Vaselyuk<sup>b

a</sup> Ioffe Institute, St. Petersburg
^b Department of Electronic and Electrical Engineering, Trinity College, Dublin 2, Ireland

Abstract: Raman spectra have been measured in the spectral range from 1000 to 1800 cm$^{-1}$ on samples of amorphous carbon modified with platinum in amounts comparable with that of carbon. Also, Rutherford backscattering spectra have been studied. It is shown that, as the platinum concentration is raised to $\sim$0.5 $\times$ 10$^{22}$ at cm$^{-3}$, the average size of graphene clusters increases. As the platinum concentration increases further, the graphene clusters become smaller in size.

Received: 27.01.2010
Accepted: 12.02.2010

 English version: Semiconductors, 2010, 44:8, 1074–1079

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