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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2010 Volume 44, Issue 5, Pages 631–635 (Mi phts8817)

This article is cited in 2 papers

Semiconductor structures, interfaces and surfaces

Effect of different chemical treatments of surface on the height of Al–$p$-SiGe and Au–$n$-SiGe barriers

I. G. Atabaev, N. A. Matchanov, M. U. Khazhiev, V. Pak, T. M. Saliev

Physical-Technical Institute, Uzbekistan Academy of Sciences

Abstract: The effect of different chemical treatments on the properties of Au–$n$-SiGe è Al–$p$-SiGe Schottky barriers has been investigated. Etching under different conditions was used to prepare surfaces with different densities of surface states $(D_{\mathrm{ss}})$. It is shown that the barrier height in the structures under study correlates with the $D_{\mathrm{ss}}$ value and germanium content in the Si$_{1-x}$Ge$_x$ alloy.

Received: 04.08.2009
Accepted: 29.09.2009


 English version:
Semiconductors, 2010, 44:5, 605–609

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