This article is cited in 3 papers

Semiconductor physics

Reliability estimate for semiconductor laser module ILPN-134

O. V. Zhuravleva, V. D. Kurnosov, A. V. Ivanov, K. V. Kurnosov, V. I. Romantsevich, R. V. Chernov

Polyus Research and Development Institute named after M. F. Stel'makh, Moscow

Abstract: The reliability of the ILPN-134 is investigated laser module. The technique, which allows one to estimate what contribution is introduced by individual processes of aging of the laser diode and the optical system to the degradation of the laser module ILPN-134, is suggested. The activation energies of degradation processes, the standard deviations, and the failure rates of the laser diode and the optical system are determined.

Received: 29.04.2009
Accepted: 04.05.2009

 English version: Semiconductors, 2010, 44:3, 359–365

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