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Fizika i Tekhnika Poluprovodnikov, 2010 Volume 44, Issue 1, Pages 96–100 (Mi phts8730)

This article is cited in 9 papers

Semiconductor physics

Active region based on graded-gap InGaN/GaN superlattices for high-power 440- to 470-nm light-emitting diodes

A. F. Tsatsul'nikovab, V. V. Lundinab, A. V. Sakharovab, E. E. Zavarinab, S. O. Usovab, A. E. Nikolaevab, N. A. Cherkashinac, B. Ya. Bera, D. Yu. Kazantseva, M. N. Mizerovb, Hee Seok Parkd, M. Hytchc, F. Huec

a Ioffe Institute, St. Petersburg
b Submicron Heterostructures for Microelectronics Research and Engineering Center, Russian Academy of Sciences, St. Petersburg
c Center for Material Elaboration & Structural Studies of the National Center for Scientific Research, 31055 Toulouse, France
d Samsung Electro-Mechanics Co. Ltd., Suwon, Gyunggi-Do, Korea

Abstract: The structural and optical properties of light-emitting diode structures with an active region based on ultrathin InGaN quantum wells limited by short-period InGaN/GaN superlattices from both sides have been investigated. The dependences of the external quantum efficiency on the active region design are analyzed. It is shown that the use of InGaN/GaN structures as limiting graded-gap short-period superlattices may significantly increase the quantum efficiency.

Received: 08.06.2010
Accepted: 15.06.2010


 English version:
Semiconductors, 2010, 44:1, 93–97

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