This article is cited in 2 papers

Amorphous, glassy, porous, organic, microcrystalline semiconductors, semiconductor composites

Estimation of the adequacy of the fractal model of the atomic structure of amorphous silicon

A. B. Golodenko

Voronezh State Technological Academy

Abstract: A method of constructing a fractal model of noncrystalline solid substance is considered using the example of amorphous silicon. In systems of iteration functions, the physical meaning of dihedral and valence angles of the elementary crystallographic cell is assigned to arguments. The model adequacy is estimated by the radial distribution function, the atomic structure density, the distribution of valence and dihedral angles, and the density of dangling interatomic bonds.

Received: 01.04.2009
Accepted: 22.05.2009

 English version: Semiconductors, 2010, 44:1, 84–88

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