This article is cited in 11 papers

Non-electronic properties of semiconductors (atomic structure, diffusion)

Determination of the composition of binary chalcogenide glasses by X-ray fluorescence analysis

G. A. Bordovskii^a, A. V. Marchenko^a, P. P. Seregin^a, N. Smirnova^b, E. I. Terukov<sup>b

a</sup> Herzen State Pedagogical University of Russia, St. Petersburg
^b Ioffe Institute, St. Petersburg

Abstract: To quantitatively determine germanium, arsenic, sulfur, and selenium contents in As$_{1-x}$S$_x$, G$_{1-x}$S$_x$, As$_{1-x}$Se$_x$, and Ge$_{1-x}$Se$_x$ glassy alloys by X-ray fluorescence analysis, a technique using standards was developed. This technique allows quantitative determination of the composition of these glasses with an accuracy of $\pm$0.001 with respect to the parameter $x$.

 English version: Semiconductors, 2010, 44:1, 24–27

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