This article is cited in 2 papers

Non-electronic properties of semiconductors (atomic structure, diffusion)

Morphology, elemental composition, and mechanical properties of polycrystalline CdTe layers

I. V. Kurilo, G. A. Ilchuk, S. V. Lukashuk, I. A. Rudyj, V. O. Ukrainets, N. V. Chekaylo

Lviv Polytechnic National University

Abstract: The results of investigations of the morphology (grain size, twinning, growth features), elemental composition, and some mechanical properties of polycrystalline CdTe layers deposited on nonoriented substrates in a quasi-closed volume are presented. Dependences of microhardness on the crystallite size and layer thickness are presented. The evaluation calculations of the stresses on the substrate-layer interface caused by a difference in the linear thermal expansion coefficients are presented.

Received: 16.05.2011
Accepted: 26.05.2011

 English version: Semiconductors, 2011, 45:12, 1531–1537

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