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Fizika i Tekhnika Poluprovodnikov, 2011 Volume 45, Issue 11, Pages 1486–1488 (Mi phts8678)

Semiconductor structures, low-dimensional systems, quantum phenomena

Electroluminescence at a wavelength of 1.54 $\mu$m in Si:Er/Si structures consisting of a number of $p$$n$ junctions

V. P. Kuznetsovab, M. V. Stepikhovab, V. B. Shmaginb, M. O. Marychevc, N. A. Alyabinaa, M. V. Kuznetsova, B. A. Andreevb, A. V. Kornaukhova, O. N. Gorshkova, Z. F. Krasil'nikb

a Scientific-Research Physicotechnical Institute at the Nizhnii Novgorod State University, Nizhnii Novgorod
b Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
c Lobachevsky State University of Nizhny Novgorod

Abstract: A method of connecting several $p^+$$n$ junctions in the same Si:Er/Si structure is demonstrated; this method makes it possible to increase the electroluminescence intensity at a wavelength of 1.54 $\mu$m. The structures have been grown by sublimation molecular-beam epitaxy.

Received: 12.04.2011
Accepted: 18.04.2011


 English version:
Semiconductors, 2011, 45:11, 1430–1432

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