L. V. Berman, Sh. M. Kogan, “Using Photoelectric Spectroscopy to Estimate Semiconductor Material Quality (Review)”, Fizika i Tekhnika Poluprovodnikov, 1987, Volume 21, Issue 9,Pages <nobr>1537

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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 1987 Volume 21, Issue 9, Pages 1537–1554 (Mi phts857)

Using Photoelectric Spectroscopy to Estimate Semiconductor Material Quality (Review)

L. V. Berman, Sh. M. Kogan