This article is cited in 30 papers

Surface, interfaces, thin films

Physical properties of SnS thin films fabricated by hot wall deposition

S. A. Bashkirov, V. F. Gremenok, V. A. Ivanov

Scientific-Practical Materials Research Centre of NAS of Belarus

Abstract: The dependence of the microstructure and optical properties of SnS thin films fabricated by hot wall deposition onto glass substrates on the deposition conditions is studied. Phase and elemental composition, surface morphology, and transmission spectra of the obtained films are investigated within the wavelength range 400–2500 nm. The single-phase films feature near-stoichiometric elemental composition and a high degree of preferential orientation in the (040) plane. The optical band gap for direct transitions is 1.07–1.27 eV, depending on film thickness.

Received: 18.11.2010
Accepted: 01.12.2010

 English version: Semiconductors, 2011, 45:6, 749–752

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