This article is cited in 6 papers

Micro- and nanocrystalline, porous, composite semiconductors

The effect of thermal annealing on the structure of nanocrystalline zinc sulfide films

P. N. Krilov, È. A. Romanov, I. V. Fedotova

Udmurt State University, Izhevsk

Abstract: The effect of thermal annealing on the structure of nanocrystalline ZnS films obtained at negative (centigrade) condensation temperatures on NaCl, Si, and SiO$_2$ substrates has been studied. It is shown that the structure of zinc sulfide films on Si and SiO$_2$ substrates differs from that of films on NaCl substrates. The hexagonal phase appears in the films on NaCl and disappears upon annealing. The appearance and disappearance of this phase is due to the effect of stresses in the film-substrate system.

Received: 13.04.2010
Accepted: 22.04.2010

 English version: Semiconductors, 2011, 45:1, 125–129

Bibliographic databases:

•