RUS  ENG
Full version
JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2011 Volume 45, Issue 1, Pages 57–61 (Mi phts8435)

This article is cited in 2 papers

Surface, interfaces, thin films

The morphology, electron structure, and optical properties of self-assembled silicon nanostructures on the surface of highly oriented pyrolytic graphite

A. V. Nezhdanov, D. O. Filatov, D. A. Antonov, S. Yu. Zubkov, A. I. Mashin, A. V. Ershov

Lobachevsky State University of Nizhny Novgorod

Abstract: The results of studies of the morphology, electronic structure, and optical properties of self-assembled silicon nanostructures on the surface of highly oriented pyrolytic graphite are reported. The structures are fabricated by electron-beam-assisted evaporation in high-vacuum conditions. It is found that, at thicknesses of about one monolayer, the atomic structure of the layer is similar to that of graphene with the interatomic spacing $\sim$2.4 $\mathring{\mathrm{A}}$. At film thicknesses larger than one monolayer, clusters about 5 nm in dimensions are formed on the substrate surface.

Received: 04.05.2010
Accepted: 18.05.2010


 English version:
Semiconductors, 2011, 45:1, 56–60

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2026