Abstract:
Commercial AlGaN ultraviolet LEDs with emission wavelength of 270–280 nm and external quantum efficiency of 5.7% were studied. $C$–$V$ profiling revealed an order of magnitude higher electron concentration in the active region compared to blue LEDs, caused by overdoping with silicon. Analysis of electroluminescence spectra and frequency dependences of the spectral density of low-frequency noise revealed the rearrangement of excited defects in ultraviolet LEDs at injection levels an order of magnitude lower than in blue LEDs, as well as the onset of defect generation during aging after 25 h.