Abstract:
To study the modification of the cadmium sulfide plate surface during deposition and annealing of an iron arachinate coating, we used atomic force microscopy in the amplitude modulation mode to obtain images of the surface relief, distributions of feedback circuit mismatch signals, and phase contrast. It was shown that the combined use of atomic force microscopy oscillatory techniques allowed us to characterize all stages of the creation of the diluted semimagnetic semiconductor material CdS:Fe. New features of the studied surfaces were also discovered by analyzing the statistical parameters obtained from images of atomic force microscopy.