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Manufacturing, processing, testing of materials and structures
DLTS Study of plastically deformed copper-doped $n$-type germanium
S. A. Shevchenko,
A. I. Kolyubakin Osipyan Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow region
Abstract:
Classical deep level transient spectroscopy (DLTS) and its modification are used to study the time constants of electron capture by substitutional Cu
$_s^{2-}$ atoms and thermal electron emission from Cu
$_s^{3-}$ atoms in plastically deformed Cu-doped
$n$-type germanium. The activation energy
$E_\sigma$, the electron capture cross-section, the energy
$E_3$ of the third acceptor level of Cu
$_s^{3-}$ atoms, and the ionization entropy are determined. The lack of
$E_3$-level broadening, the exponential capture kinetics for a filling-pulse duration of
$t_p\lesssim$ 1 ms, the fact that the Cu
$_s^{2-/3-}$-atom recombination parameters are independent of the dislocation density, and the low concentration of Cu
$_s^{2-/3-}$ atoms in the deformed samples suggest that the DLTS spectra are due to Cu
$_s^{2-/3-}$ atoms located outside the Read cylinders.
Received: 25.06.2012
Accepted: 20.07.2012
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