V. B. Shmagin, K. E. Kudryavtsev, A. V. Novikov, D. V. Shengurov, D. V. Yurasov, Z. F. Krasil'nik, “Hodographs in diode-structure diagnostics”, Fizika i Tekhnika Poluprovodnikov, 2015, Volume 49, Issue 11,Pages <nobr>1492

XIX Symposium "Nanophysics and Nanoelectronics", Nizhny Novgorod, March 10-14, 2015

Hodographs in diode-structure diagnostics

V. B. Shmagin^ab, K. E. Kudryavtsev^ab, A. V. Novikov^ab, D. V. Shengurov^ab, D. V. Yurasov^ab, Z. F. Krasil'nik^ab

^a Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
^b Lobachevsky State University of Nizhny Novgorod

Abstract: The use of hodographs in the diagnostics of silicon diode structures is illustrated. This approach minimizes the error in determining the capacitance of the $p$–$n$ junction due to masking elements that distort direct measurements in parallel and serial equivalent circuits.

Received: 22.04.2015
Accepted: 12.05.2015