Abstract:
The broadband stimulated emission in the spectral range $\lambda$ = 380–700 nm with the inhomogeneous broadening has been experimentally obtined in the heavily doped Al$_{0.68}$Ga$_{0.32}$N : Si structures grown by molecular beam epitaxy. The behavior of the intensities and spectra of stimulated emission from the edge of the active element with transverse pulsed pumping by radiation with $\lambda$ = 266 nm, measured at room temperature, demonstrate the threshold behavior and optical gain. For stimulated emission with a maximum at $\lambda$ = 500 nm, the minimum threshold pump power density was 6.5 kW/cm$^2$ for excited region length of 1.5 mm. The parameters and contributions of the two main processes $e$–$A$ and $D$–$A$ of radiative recombination in the excited structures for stimulated emission and optical gain are studied.