Abstract:
Initial stage of precipitate formation during post-growth annealing of nonstoichiometric GaAs and GaAs$_{0.97}$Sb$_{0.03}$ grown by low-temperature (150$^\circ$C) MBE on GaAs (001) substrate with intermediate growth interruption and simultaneous heating up to 250$^\circ$C was studied by transmission electron microscopy. Short-term intermediate heating despite the low temperature was revealed to result in the precipitation of larger particles during subsequent post-growth annealing compared to the material not subjected to such heating. This effect is explained by the huge concentration of excess arsenic in LT-GaAs and LT-GaAs$_{0.97}$Sb$_{0.03}$ grown at 150$^\circ$C, enhanced diffusion due to the high concentration of nonequilibrium gallium vacancies, and non-threshold nucleation.