International Conference Physics.SPb/2024, October 21-25, 2024, St. Petersburg

Infrared photoreflectance of Cd$_{0.3}$Hg$_{0.7}$Te epitaxial films

M. S. Ruzhevich^a, K. J. Mynbaev^ab, D. D. Firsov^c, I. V. Chumanov^c, O. S. Komkov^c, V. S. Varavin^d, M. V. Yakushev<sup>d

a</sup> ITMO University, 197101 St. Petersburg, Russia
^b Ioffe Institute, 194021 St. Petersburg, Russia
^c Saint Petersburg Electrotechnical University 197376 St. Petersburg, Russia
^d Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, 630090 Novosibirsk, Russia

Abstract: The results of a study of photoreflectance of Cd$_{0.3}$Hg$_{0.7}$Te films grown by molecular beam epitaxy are presented. The results of photoreflectance measurements were compared with data from studies of photoluminescence and optical transmission of films after growth and after various types of annealing. For films after annealing, an improvement in quality was found, expressed in a decrease in the half-width of the photoreflectance peak.

Keywords: solid solutions, cdhgte, photoreflectance.

Received: 02.05.2024
Revised: 05.09.2024
Accepted: 30.10.2024

DOI: 10.61011/FTP.2024.10.59377.6488A

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