Surface, interfaces, thin films

Investigation of structure, first order optical susceptibility, non-linear optical, electrical susceptibility results and IV characterizations of graphene multilayer

A. Abdel Moez^a, M. A. Salem^a, A. Elmeleegi^b, Z. S. Elmandouh<sup>b

a</sup> Solid State Physics Department, Physical Research Division, National Research Centre (NRC), 33 El Bohouth St., Dokki, Giza, P.O., Egypt
^b Electronic Microscope Department, Physical Research Division, National Research Centre (NRC), 33 El Bohouth St., Dokki, Giza, P.O. 12622, Egypt

Abstract: Graphene sample was synthesized using pulsed laser deposition technique. The structure for graphene sample was investigated using both of transmission electron microscopy, for powder graphene, diffraction electron microscopy, and X-ray diffraction technique for thin film. The first order of moment $M_{-1}$ and the third order of moment $M_{-3}$ were determined optically. The linear optical susceptibility $\chi^{(1)}$ for this sample was determined. Non-linear optical parameters such as third-order non-linear optical susceptibility $\chi^{(3)}$, non-linear absorption coefficient $\beta_c$, and non- linear refractive index $n_2$ were determined for this sample. The electrical susceptibility $\chi_e$ and relative permittivity $\varepsilon_r$ were calculated. The electronic results such as density of valence band, density of conduction band, and Fermi level position were determined. IV characterizations for this sample were studied in case of forward and reverse current and in case of darkness and illumination.

Keywords: graphene multilayer, non-linear optical properties, semiconducting results, IV characterizations.

Received: 17.01.2021
Revised: 17.01.2021
Accepted: 02.02.2021

Language: English