This article is cited in 4 papers

XV International Conference ''Thermoelectrics and Their Applications-2016 St. Petersburg'', November 15-16, 2016

Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness

A. N. Krushelnitckii, E. V. Demidov, E. K. Ivanova, N. S. Kablukova, V. A. Komarov

Herzen State Pedagogical University of Russia, St. Petersburg

Abstract: The results of studying the surface of 15- to 100-nm-thick bismuth films by atomic-force microscopy are reported. The near-linear character of the dependences of the average surface roughness and the average height of growth patterns on the film thickness is established. It is found that the average crystallite size increases, as the film thickness is increased. A slight dependence of the crystallite size on the film thickness is observed at thicknesses in the range of 27–70 nm.

Received: 27.12.2016
Accepted: 12.01.2017

DOI: 10.21883/FTP.2017.07.44641.27

 English version: Semiconductors, 2017, 51:7, 876–878

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