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Fizika i Tekhnika Poluprovodnikov, 2018 Volume 52, Issue 11, Pages 1308–1312 (Mi phts5686)

This article is cited in 2 papers

XXII International symposium ''Nanophysics and Nanoelectronics'', Nizhny novgorod, March, 12-15, 2018

Experimental study of spontaneous-emission enhancement in Tamm plasmon structures with an organic active region

K. M. Morozovab, K. A. Ivanovb, N. Seleninc, S. Mikhrinc, D. De Sa Pereirad, C. Menelaouc, A. P. Monkmanc, M. A. Kaliteevskiiabe

a Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
b St. Petersburg National Research University of Information Technologies, Mechanics and Optics
c Innolume GmbH, Dortmund, Germany
d Department of Physics, Durham University, Durham, United Kingdom
e Ioffe Institute, St. Petersburg

Abstract: Spontaneous-emission enhancement in a Tamm plasmon microcavity with an active region with organic material 4.4'-bis( $N$-carbazolyl)-1.1'-biphenyl (CBP) is theoretically and experimentally studied. The microcavity consisted of a Bragg reflector made of silicon oxide and tantalum oxide, over which CBP and silver layers are applied. The dependences of the Purcell modal factor on the emission direction and frequency, as well as the Purcell factor spectrum are calculated. The emission and fluorescence decay spectra in time are measured in the ultraviolet range. It is found that the probability of spontaneous emission increases and the maximum Purcell factor reaches three at frequencies corresponding to eigenmodes of the Tamm plasmon.

Keywords: Tamm Plasmon (TPs), Spontaneous Emission Enhancement, Organic Active Region, Purcell Factor, Tantalum Oxide.

Received: 25.04.2018
Accepted: 07.05.2018

DOI: 10.21883/FTP.2018.11.46589.11


 English version:
Semiconductors, 2018, 52:11, 1420–1423

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