XVI International conference ''Thermoelectrics and their applications" - 2018 (ISCTA 2018), St. Petersburg, October, 2018

Setup for measuring the thermoelectric properties of ultrathin wires

O. N. Uryupin, A. A. Shabaldin

Ioffe Institute, St. Petersburg

Abstract: An experimental setup is developed to measure the thermoelectric properties of semiconductor nanowires with diameters of up to 5 nm in dielectric matrices. This setup makes it possible to measure the electrical resistance and thermoelectric power of nanostructured samples in the temperature range of 77–400 K.

Received: 20.12.2018
Revised: 24.12.2018
Accepted: 28.12.2018

DOI: 10.21883/FTP.2019.05.47567.25

 English version: Semiconductors, 2019, 53:5, 695–698

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