Abstract:
The features of transient processes under the field effect in PbSnTe:In films with a variation in the current up to a factor of 10$^5$ are studied at helium temperatures. These features qualitatively correspond to a model, in which a high concentration of traps with different parameters is present on the PbSnTe:In surface. The role of the surface is confirmed by a strong variation in the experimental characteristic after the chemical removal of native oxides from the PbSnTe:In surface and its passivation by an Al$_2$O$_3$ layer.
Keywords:PbSnTe:In solid solution, field effect, surface conductivity, MIS structure.