Abstract:
Was been performed the analysis of electric parameters of a new generation of RF LDMOS transistors developed by JSC “NIIET”. In comparison with the devices of the previous generation was revealed a significant suppression of the effect of quasi-saturation of $I_D$–$U_G$ and
$I_D$–$U_D$ characteristics. Comparison with a foreign-made device shows that the achieved results are close to the world level.
Keywords:power RF transistors, LDMOS, quasi-saturation of I–V characteristics.