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JOURNALS // Problemy Fiziki, Matematiki i Tekhniki (Problems of Physics, Mathematics and Technics) // Archive

PFMT, 2020 Issue 2(43), Pages 43–45 (Mi pfmt709)

PHYSICS

Structure, morphology and optical characteristics of CdS thin films

V. V. Khoroshkoa, V. F. Gremenokb, I. N. Tsyrelchuka, O. D. Aksenova, V. K. Lia

a Belarusian State University of Informatics and Radioelectronics, Minsk
b Scientific and Practical Center for Materials of National Academy of Sciences of Belarus, Minsk

Abstract: The results of the formation CdS thin films by chemical deposition using various thechnics of stirring an aqueous solution and the position of the substrate are presented. The structural, morphological, and optical properties CdS thin films were studied. X-ray diffraction patterns showed the peaks (111), (220), and (311) of CdS. The values of the band gap are in the range 2,39–2,48 eV, which corresponds to the published data. The use of methods allows the formation of thin films.

Keywords: thin films, CdS, physical properties.

UDC: 621.383.51

Received: 30.12.2020



© Steklov Math. Inst. of RAS, 2026