Abstract:
We investigate the effects of annealing and presence of the Pd buffer sublayer on the modifications of interfaces and crystal
structure of multilayered Co/Pd thin films deposited by the thermal evaporation method and with the thicknesses of Co 0.2–0.4
nm and Pd 0.6–1.0 nm at which one can expect the maximum magnetic anisotropy.
Keywords:Co/Pd thin films, perpendicular magnetic anisotropy, interfaces of multilayered thin films, crystal structure of thin films, X-ray reflectivity, thin films analysis by X-ray diffraction, X-ray diffraction of thin films with inclination of diffraction vector with respect to the surface normal.