This article is cited in 1 paper

PHYSICS

Nonlinear susceptibility of the thin film of dense resonant medium

T. V. Timoschenko, Yu. V. Yurevich

A. A. Kuleshov Mogilev State University, Mogilev, Belarus

Abstract: The computing estimation of a dielectric susceptibility dispersive dependence of a thin layer of the dense resonant medium taking into account absorption saturation is carried out. The possibility of bistability in Lorentz complex function and hysteresis jumps in film resonant reflection are specified.

Keywords: thin optical films, resonant reflection, dipole-dipolar interaction.

UDC: 535.33:621.375

Received: 16.09.2014