This article is cited in 2 papers

Математические основы компьютерной безопасности и надёжности вычислительных и управляющих систем

About unreliability bounds for circuit with inverse faults and functional element breakdowns

M. A. Alekhina, O. U Barsukova

Penza State University

Abstract: The realization of Boolean functions by circuits of unreliable functional elements is considered in an arbitrary complete basis. It’s supposed that all circuit elements are independently of each other proned to faults of two types: output inverse faults and element breakdowns. Upper and lower asymptotical bounds of circuit unreliability are presented.

Keywords: Boolean functions, functional element, circuit, unreliability of circuit, output inverse faults, element breakdowns.

UDC: 519.718