Abstract:
A theoretical method for investigating reflection of a finite-aperture plane light beam from a flat-layered structure in the Kretschmann scheme is considered. The developed theory is applied for investigating the Goos–Hänchen effect, which arises upon incidence of a linearly polarized light beam with the polarization vector lying in the plane of incidence ($p$-polarized beam) and which is that, upon reflection, the incident beam is divided into two close beams of the same polarization. The accuracy of sensors based on this effect is discussed.