Spectroscopy of condensed matter

Study of plasmon resonance in Bi$_2$Se$_3$ and Sb$_2$Te$_3$ by infrared spectral ellipsometry

E. G. Alizade

Institute of Physics Azerbaijan Academy of Sciences, Baku, Azerbaijan

Abstract: In the infrared region of the spectrum (IR), the optical properties of single-crystal samples of narrow-gap degenerate semiconductors Bi$_2$Se$_3$ and Sb$_2$Te$_3$ are investigated by infrared spectral ellipsometry (SE). The transport properties of the Drude fitting of dielectric functions obtained by spectroscopic ellipsometry are studied. The behavior of the bulk and surface plasmon polaritons is investigated in detail. The dispersion and mean free path of the plasmon, the depth of the skin layer for the conducting and dielectric surfaces are calculated. The contribution of the plasmon to the optical properties is estimated from the spectral density for the Bi$_2$Se$_3$ and Sb$_2$Te$_3$ samples.

Keywords: ellipsometry, plasmon, plasmonics, plasmon dispersion, plasmon mean free path, plasmon penetration depth.

Received: 29.07.2021
Revised: 30.09.2021
Accepted: 06.10.2021

DOI: 10.21883/OS.2022.02.51991.2599-21

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