Holography

The effect of interference in thin films on the optical characteristics of holograms recorded on As–Se layers

N. M. Ganzherli

Ioffe Institute, St. Petersburg, Russia

Abstract: The effect of interference in thin films on the optical characteristics of holograms recorded on the layers of a chalcogenide glassy semiconductor of the As–Se system has been evaluated. The changes in the magnitude of reflection, transmission and optical difference in the path of the rays during the action of actinic He–Ne laser radiation on the layers are measured.

Keywords: interference in thin films, chalcogenide glassy semiconductors, refractive index, reflection, transmission, optical path difference, diffraction effectivity of holograms.

Received: 14.04.2023
Revised: 14.04.2023
Accepted: 08.05.2023

DOI: 10.61011/OS.2023.08.56299.4859-23

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