RUS
ENG
Full version
JOURNALS
// Zhurnal Tekhnicheskoi Fiziki
// Archive
Zhurnal Tekhnicheskoi Fiziki,
2026
Volume 96,
Issue 2,
Pages
336–344
(Mi jtf9657)
Solid-State Electronics
Модификация параметров AlGaN/GaN-транзисторных структур пассивацией и обработкой в водородной плазме
A. V. Kovalchuk
a
,
V. E. Zemlyakov
b
,
S. I. Kartsev
b
,
D. S. Shpakov
b
,
S. Yu. Shapoval
a
a
Institute of Microelectronics Technology and High-Purity Materials RAS
b
National Research University of Electronic Technology
Received:
08.05.2025
Revised:
07.08.2025
Accepted:
14.08.2025
DOI:
10.61011/JTF.2026.02.62293.109-25
Fulltext:
PDF file (507 kB)
©
Steklov Math. Inst. of RAS
, 2026