RUS  ENG
Full version
JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 2010 Volume 80, Issue 9, Pages 97–103 (Mi jtf9561)

Optics, Quantum Electronics

Aberration-free long lateral shear interferometry

A. I. But', A. M. Lyalikov

Yanka Kupala State University of Grodno

Abstract: The possibility is considered of increasing the degree of compensation of residual aberrations in holographic long lateral shear interferometry by using several reference patterns recorded at different lateral shear lengths. This aberration compensation technique was used to visualize distributions of refractive index variations in glass samples of different sizes and shapes that appear as a result of a thermal action on them.


 English version:
Technical Physics, 2010, 55:9, 1330–1335

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2026